|Name||Miss Alexandra Patron|
|Organization||University of North Florida|
In-situ Spectroscopic Ellipsometry as a Tool to Characterize Cu-Ligated Mercaptoalkanoic Acid Multilayers
Alexandra M. Patron, Jackson K. Neuman, Corey P. Causey, Thomas J. Mullen
Department of Chemistry, University of North Florida, 1 UNF Drive, 50/3500, Jacksonville, FL 32224
Complex nanometer-scale surface structures have a broad range of applications in nanoelectronics, lithography, and biosensors. In particular, Cu-ligated mercaptoalkanoic acid multilayers assembled onto Au have been utilized to define single-nanometer nanogaps between two registered metal surface structures. The quality of these multilayers is an important characteristic in generating reproducible nanometer-scale structures. Therefore, we explore the capabilities of in-situ spectroscopic ellipsometry to characterize the assembly of Cu-ligated mercaptoalkanoic acid monolayers and multilayers and compare our results to other surface analytical methods.