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NameMiss Alexandra Patron
OrganizationUniversity of North Florida
TopicMaterials Chemisry

In-situ Spectroscopic Ellipsometry as a Tool to Characterize Cu-Ligated Mercaptoalkanoic Acid Multilayers


Alexandra M. Patron, Jackson K. Neuman, Corey P. Causey, Thomas J. Mullen

Author Location(s)

Department of Chemistry, University of North Florida, 1 UNF Drive, 50/3500, Jacksonville, FL 32224


Complex nanometer-scale surface structures have a broad range of applications in nanoelectronics, lithography, and biosensors. In particular, Cu-ligated mercaptoalkanoic acid multilayers assembled onto Au have been utilized to define single-nanometer nanogaps between two registered metal surface structures.  The quality of these multilayers is an important characteristic in generating reproducible nanometer-scale structures.  Therefore, we explore the capabilities of in-situ spectroscopic ellipsometry to characterize the assembly of Cu-ligated mercaptoalkanoic acid monolayers and multilayers and compare our results to other surface analytical methods.